Schottky barrier height measurements of Cu/Si(001), Ag/Si(001), and Au/Si(001) interfaces utilizing ballistic electron emission microscopy and ballistic hole emission microscopy
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چکیده
منابع مشابه
Ballistic Electron Emission Microscopy/Spectroscopy on Au/Titanylphthalocyanine/GaAs Heterostructures
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ژورنال
عنوان ژورنال: AIP Advances
سال: 2013
ISSN: 2158-3226
DOI: 10.1063/1.4831756